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50 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Structural investigations of gold-to-gold wafer bonding interfaces, Materials Science and Engineering: B 110 (2004.06.25) 64-67.
49 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Growth of gallium oxide thin films on silicon by the metal organic chemical vapor deposition method, Materials Science and Engineering: B 110 (2004.06.25) 34-37.
48 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Annealing effects on the properties of Ga2O3 thin films grown on sapphire by the metal organic chemical vapor deposition, Applied Surface Science 230 (2004.05.31) 301-306.
47 (SCIE) Taejong Eom, Hyoun Woo Kim, Chongmu Lee*, ECR Plasma Precleaning for RuO2 MOCVD, Journal of the Korean Physical Society 44 (2004.05.15) 1083-1087.
46 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Chongmu Lee, Growth of Ga2O3 thin films on Si(100) substrates using a trimethylgallium and oxygen mixture, Journal of Materials Science 39 (2004.05) 3461-3463.
45 (SCIE) Nam Ho Kim, Hyoun Woo Kim*, Room temperature growth of high quality ZnO thin film on sapphire substrates, Journal of Materials Science 39 (2004.05) 3235-3236.
44 (SCIE) Jongmin Lim, Kyoungchul Shin, Hyoun Woo Kim, Chongmu Lee*, Effect of annealing on the photoluminescence characteristics of ZnO thin films grown on the sapphire substrate by atomic layer epitaxy, Materials Science and Engineering: B 107 (2004.03.25) 301-304.
43 (SCIE) Hyoun Woo Kim*, Vertical Etching of Ru Electrodes Using the O2/Cl2 System, Materials Science Forum 449-452 (2004.03) 357-360.
42 (SCIE) Hyoun Woo Kim*, Plasma Etching for Fabricating the Concave-Type DRAM Capacitors, Materials Science Forum 449-452 (2004.03) 353-356.
41 (SCIE) S. M. Kang, T. J. Eom, S. J. Kim, H. W. Kim, J. Y. Cho, Chongmu Lee*, Reverse recovery characteristics and defect distribution in an electron-irradiated silicon p-n junction diode, Materials Chemistry and Physics 84 (2004.03) 187-191.